ITC'99 Benchmark Circuits - Preliminary Results

• 24 August 2005
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• No. 10893539,p. 1125
• https://doi.org/10.1109/test.1999.805857

Abstract

Keywords

• AUTOMATIC TEST PATTERN GENERATION
• SOFTWARE TESTING
• SUN
• CLOCKS
• MODEMS
• BENCHMARK TESTING
• SYSTEM TESTING
• MICROPROCESSORS
• APPLICATION SPECIFIC INTEGRATED CIRCUITS
• EXPLOSIONS