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Optical Evaluation of Polycrystalline Silicon Surface Roughness
Home
Publications
Optical Evaluation of Polycrystalline Silicon Surface Roughness
Optical Evaluation of Polycrystalline Silicon Surface Roughness
KC
K. L. Chiang
K. L. Chiang
CD
C. J. Dell'Oca
C. J. Dell'Oca
FS
F. N. Schwettmann
F. N. Schwettmann
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1 December 1979
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 126
(12)
,
2267-2269
https://doi.org/10.1149/1.2128941
Abstract
No abstract available
Cited
Cited by 20 articles
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