Can supply current monitoring be applied to the testing of analogue as well as digital portions of mixed ASICs?
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Investigations are made into the suitability of supply current monitoring as a technique for the testing of analogue circuit modules. Iddq monitoring is already recognised in the digital field. The possibility of a unified testing approach for mixed ASICs is raised. The potential effectiveness of the method is investigated. Simulation results are reported to illustrate typical supply current levels for nominal and defective circuits. Analogue fault detection by this technique is compared with detection by observation of the circuit's output.Keywords
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