Effects of Total Dose Ionizing, Radiation on the 1802 Microprocessor

1 January 1977

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 24 (6) , 2172-2176
https://doi.org/10.1109/TNS.1977.4329186

Abstract

Several versions of the 1802 CMOS microprocessor were subjected to Co-60 irradiations. Total dose data is provided for production line parts from two vendors, a specially processed radiation hard lot, and one developmental SOS unit. The increase in total dose failure level from 1 x 104 to 5 x 105 rads(Si) for the specially processed Parts proves the feasibility of hardening the Si-gate LSI technology used for the 1802.

Keywords

IONIZING RADIATION
MICROPROCESSORS
TESTING
PRODUCTION
CMOS TECHNOLOGY
SPACE TECHNOLOGY
CLOCKS
LABORATORIES
RADIATION HARDENING
LEAKAGE CURRENT

This publication has 1 reference indexed in Scilit:

The Effects of Ionizing Radiation on Various CMOS Integrated Circuit Structures
IEEE Transactions on Nuclear Science, 1972