Charged particle induced X-ray analysis: A new tool in forensic science
- 1 March 1973
- journal article
- research article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 15 (1) , 13-25
- https://doi.org/10.1007/bf02516553
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Tables for born approximation calculations of K- and L-shell ionization by protons and other charged particlesAtomic Data and Nuclear Data Tables, 1969
- Study of Nuclear Structure by Electromagnetic Excitation with Accelerated IonsReviews of Modern Physics, 1956
- XCIII. The high-frequency spectra of the elementsJournal of Computers in Education, 1913