Conductor loss on transmission lines in monolithic microwave and millimeter‐wave integrated circuits

1 January 1992

journal article
Published by Wiley in International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering

Vol. 2 (3) , 155-167
https://doi.org/10.1002/mmce.4570020304

Abstract

A field‐theoretical analysis of conductor loss on planar transmission lines is presented. The full‐wave approach employed holds for arbitrary values of metallization thickness and skin depth. Its validity is checked by comparison to measurement data on coplanar waveguide (CPW). The results are discussed and compared with modeling approaches available so far. The considerations concentrate on the CPW case where, in contrast to the microstrip structures used in hybrid ICs, a significant influence of the fields inside the lossy conductors can be detected. Finally, conclusions regarding both millimeter‐wave integrated circuit design and modeling are drawn. © 1992 John Wiley & Sons, Inc.

Keywords

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