Magnetic and X-ray diffraction characterization of stoichiometric Pr2NiO4 and Nd2NiO4 oxides
- 31 October 1989
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 72 (3) , 273-277
- https://doi.org/10.1016/0038-1098(89)90809-0
Abstract
No abstract availableKeywords
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