Cross-Tie Walls in Thin Films
- 1 May 1960
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (5) , S306-S307
- https://doi.org/10.1063/1.1984712
Abstract
Various properties of cross-tie walls are summarized. Several new Bitter pattern experiments dealing with cross-tie walls are described. The first experiment firmly determines the magnetization distribution about a cross-tie, with the aid of an applied field at 45° to the wall. The second experiment tests the stability of cross-tie walls. It is shown in this experiment that another wall configuration is possible. This is discussed in light of the buckling mechanism of film switching.This publication has 3 references indexed in Scilit:
- Observations Made on Domain Walls in Thin FilmsJournal of Applied Physics, 1959
- Internal Structure of Cross-Tie Walls in Thin Permalloy Films through High-Resolution Bitter TechniquesJournal of Applied Physics, 1959
- Domain-Wall Structure in Permalloy FilmsJournal of Applied Physics, 1958