High-resolution electron microscopy observations of the layer structures and stacking faults in molybdenite crystals

Abstract
A [100] image of a hexagonal MoS2 crystal was observed by high-resolution transmission electron microscopy using an ultramicrotomed section of molybdenite. It is shown that in the image the Mo and S columns along the [100] axis can be distinguished and then the stacking sequence of Mo and S layers can be determined, with the aid of image simulation. A new kind of stacking fault has been found. The layer structure and the formation mechanism of this stacking fault are presented.