Field-Evaporation of Tungsten in Field Ion Microscope
- 1 October 1968
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 7 (10)
- https://doi.org/10.1143/jjap.7.1202
Abstract
The enhancement factors β1 and β2 of electric field applied on surface atoms are obtained by means of electrobath and resistance network analogue computer. The results are in good agreement with experimental results by field ion microscope. Field-evaporation end patterns of tungsten at wide temperature range are investigated in connection with cohesion of surface atoms. The step heights are calculated for various planes of tungsten, molybdenum and tantalum, which are necessary to the calculation of local radii of curvature.Keywords
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