Macro Testing: Unifying IC And Board Test
- 1 December 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 3 (6) , 26-32
- https://doi.org/10.1109/mdt.1986.295048
Abstract
Historically, IC testing and board testing have been considered two separate subjects. However, today's increasing complexity in both design and technology has given rise to a number of efforts to produce a consistent test strategy that smoothly couples both types of testing. This article describes one such effort by Philips, a design for testability methodology for semicustom VLSI circuits. The methodology is based on the partitioning of a design into testable macros, hence the term ¿macro testing.¿ The challenges in this approach are the partitioning itself, the selection of a test technique suited to the separate macros and the chip's architecture, the execution of a macro test independent of its environment, and the assembly of macro tests into a chip test.Keywords
This publication has 4 references indexed in Scilit:
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- Chip Partitioning Aid: A Design Technique for Partitionability and Testability in VLSIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
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