Experimental considerations for in situ X-ray scattering analysis of OMVPE growth
- 1 May 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 291 (1-2) , 86-92
- https://doi.org/10.1016/0168-9002(90)90038-8
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Investigation of the Efficiency of Activated Carbon for the Removal of Diethyltellurium from a Carrier Gas StreamJournal of the Electrochemical Society, 1989
- Growth kinetics in the MOVPE of ZnSe on GaAs using zinc and selenium alkylsJournal of Crystal Growth, 1986
- Angle and index calculations for `z-axis' X-ray diffractometerJournal of Applied Crystallography, 1985
- A novel X-ray scattering diffractometer for studying surface structures under UHV conditionsNuclear Instruments and Methods in Physics Research, 1984
- Atomic structure of Si{001}2×1Physical Review B, 1983
- Angle calculations for 3- and 4-circle X-ray and neutron diffractometersActa Crystallographica, 1967