Spin-Polarized Scanning Electron Microscope for Analysis of Complicated Magnetic Domain Structures
- 1 September 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (9A) , L758
- https://doi.org/10.1143/jjap.25.l758
Abstract
A previously reported spin-polarized scanning electron microscope has been improved to form a magnetic domain image using any magnetization vector component in the sample surface plane. This apparatus makes it possible to observe the magnetic domain structure in finer contrast. In addition, the magnetization directions in the sample surface can alsobe determined semi-quantitatively by inspecting two images obtained from the mutually orthogonal components of the magnetization vector.Keywords
This publication has 4 references indexed in Scilit:
- High Spatial Resolution Spin-Polarized Scanning Electron MicroscopeJapanese Journal of Applied Physics, 1985
- Spin-Polarized Scanning Electron MicroscopyJapanese Journal of Applied Physics, 1985
- Domain observation with spin-polarized secondary electrons (invited)Journal of Applied Physics, 1985
- Scanning Electron Microscope Observation of Magnetic Domains Using Spin-Polarized Secondary ElectronsJapanese Journal of Applied Physics, 1984