The use of scanning electron microscopy to study the ion beam sputter modification of the surface topography of biological implants
- 1 September 1982
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 17 (9) , 2599-2604
- https://doi.org/10.1007/bf00543893
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Influence of the ion incidence angle of alumina surface cleanness, roughness and topographyJournal of Materials Science, 1982
- Topography of ion-etched Corning 7059 glassJournal of Materials Science, 1981
- Ion beam texturingJournal of Vacuum Science and Technology, 1977
- A glow discharge ion gun for etchingVacuum, 1973
- A study of cones developed by ion-bombardment of goldJournal of Materials Science, 1971