Automatic partitioning for deterministic test

Publisher Website

2 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 322-325
https://doi.org/10.1109/eurdac.1992.246224

Abstract

No abstract available

Keywords

AUTOMATIC PARTITIONING FOR DETERMINISTIC TEST

This publication has 1 reference indexed in Scilit:

An easily computed functional level testability measure
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003