Birefringence reduction in side-written photoinduced fiber devices by a dual-exposure method
- 15 August 1994
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 19 (16) , 1260-1262
- https://doi.org/10.1364/ol.19.001260
Abstract
An in situ birefringence measurement in conjunction with an atomic force microscope study shows that the geometric asymmetry of the side-writing process is a major cause of the induced birefringence in grating-based fiber devices. Measured refractive-index profiles of UV-exposed fibers clearly show the asymmetry in the induced index change. We demonstrate the use of a dual-exposure technique for producing low-birefringence devices.Keywords
This publication has 4 references indexed in Scilit:
- Polarimetric heterodyning Bragg-grating fiber-laser sensorOptics Letters, 1993
- Stable single-mode erbium fiber-grating laser for digital communicationJournal of Lightwave Technology, 1993
- Influence of refractive index nonlinearities on modulation and noise properties of semiconductor lasersElectronics Letters, 1992
- Formation of Bragg gratings in optical fibers by a transverse holographic methodOptics Letters, 1989