Moire' Patterns and Two-Dimensional Aliasing in Line Scanner Data Acquisition Systems
- 1 January 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Geoscience Electronics
- Vol. 12 (1) , 1-8
- https://doi.org/10.1109/tge.1974.294324
Abstract
The basic mechanism underlying the generation of Moire' patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. System design requirements for avoiding Moire' pattern generation and two-dimensional aliasing are discussed.Keywords
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