Spectral dependence of the photoresponse in MIM structures: Influence of the electrode thickness
- 31 July 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 28 (1) , 107-117
- https://doi.org/10.1016/0040-6090(75)90279-5
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Internal Photoemission as a Tool for the Study of InsulatorsJournal of the Electrochemical Society, 1968
- Contribution á l'étude des phénomènes de transport dans les structures aluminium–alumine–métalPhysica Status Solidi (b), 1967
- Photoemission Studies on Thin Metal‐Insulator‐Metal SandwichesPhysica Status Solidi (b), 1967
- Photovoltage Measurements on an Al-Al2O3-Al Thin-Film SandwichJournal of Applied Physics, 1966
- VOLTAGE DEPENDENCE OF BARRIER HEIGHT IN AlN TUNNEL JUNCTIONSApplied Physics Letters, 1966
- Potential Barrier Parameters in Thin-Film Al–Al2O3-Metal DiodesJournal of Applied Physics, 1966
- Hot-Electron Attenuation in ThinFilmsPhysical Review Letters, 1965
- Photo-effects in thin oxide film sandwich structuresSolid-State Electronics, 1965
- Photocurrents Through Thin Films of Al2O3Journal of Applied Physics, 1965
- Photoemissive Determination of Barrier Shape in Tunnel JunctionsPhysical Review Letters, 1965