Thermally Stimulated Current Measurement of Traps in Detector-Grade CdTe
- 1 February 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 23 (1) , 177-181
- https://doi.org/10.1109/tns.1976.4328233
Abstract
Thermally stimulated current (TSC) has been measured in γ detector-grade, high resistivity CdTe:In and CdTe:In,Cl. Electron mobility-trapping time products, μτ+, measured at room temperature correlate strongly with the shape and magnitude of a prominent TSC band observed at 40 K. This correlation is used as the basis for a simple method of selecting samples appropriate for detector applications.Keywords
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