Trapping Effects in Drift Mobility Experiments

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Abstract
Theoretical expressions have been derived for the charge‐distribution function and resultant voltage‐decay curve applicable to drift mobility experiments in the presence of traps. The charge‐distribution function was obtained under the assumption of constant electric field and the neglect of recombination and diffusion. The results are, therefore, limited to the case of low carrier densities. The general expression for the voltage‐decay curve is quite complicated, but useful approximations are made for various time regions. In addition, it is shown how the theory may be applied to the xerographic discharge mode under certain limited conditions.