Radiographic screen–film noise power spectrum: variation with microdensitometer slit length
- 15 August 1981
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 20 (16) , 2795-2798
- https://doi.org/10.1364/ao.20.002795
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Fast Fourier digital quantum mottle analysis with application to rare earth intensifying screen systemsMedical Physics, 1977
- Scans in Measuring Wiener Spectra for Photographic GranularityJapanese Journal of Applied Physics, 1966
- New Method of Describing and Measuring the Granularity of Photographic MaterialsJournal of the Optical Society of America, 1955