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IBM experiments in soft fails in computer electronics (1978–1994)
Home
Publications
IBM experiments in soft fails in computer electronics (1978–1994)
IBM experiments in soft fails in computer electronics (1978–1994)
JZ
J. F. Ziegler
J. F. Ziegler
HC
H. W. Curtis
H. W. Curtis
HM
H. P. Muhlfeld
H. P. Muhlfeld
CM
C. J. Montrose
C. J. Montrose
BC
B. Chin
B. Chin
MN
M. Nicewicz
M. Nicewicz
CR
C. A. Russell
C. A. Russell
WW
W. Y. Wang
W. Y. Wang
LF
L. B. Freeman
L. B. Freeman
PH
P. Hosier
P. Hosier
LL
L. E. LaFave
L. E. LaFave
JW
J. L. Walsh
J. L. Walsh
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1 January 1996
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 40
(1)
,
3-18
https://doi.org/10.1147/rd.401.0003
Abstract
No abstract available
Cited
Cited by 305 articles
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