New Developments in Transmission Electron Microscopy for Nanotechnology
- 11 September 2003
- journal article
- Published by Wiley in Advanced Materials
- Vol. 15 (18) , 1497-1514
- https://doi.org/10.1002/adma.200300384
Abstract
No abstract availableKeywords
This publication has 94 references indexed in Scilit:
- Valence excitations in individual single-wall carbon nanotubesApplied Physics Letters, 2002
- Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical SpeciesScience, 2001
- Picometer Accuracy in Measuring Lattice Displacements Across Planar Faults by Interferometry in Coherent Electron DiffractionPhysical Review Letters, 2000
- Characterizing the Structure and Properties of Individual Wire-Like NanoentitiesAdvanced Materials, 2000
- Exit wave reconstructions using through focus series of HREM imagesMicroscopy Research and Technique, 2000
- Plasmon excitations in graphitic carbon spheres measured by EELSPhysical Review B, 2000
- Carbon Nanotube Quantum ResistorsScience, 1998
- Structural Analysis of Self-Assembling Nanocrystal SuperlatticesAdvanced Materials, 1998
- Micromechanics: A toolbox for femtoscale science: “Towards a laboratory on a tip”Microelectronic Engineering, 1997
- Magnetic field observation of a single flux quantum by electron-holographic interferometryPhysical Review Letters, 1989