Field Behavior near Singular Points in Composite Dielectric Arrangements

1 December 1978

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation

Vol. EI-13 (6) , 426-435
https://doi.org/10.1109/tei.1978.298089

Abstract

At some points on the boundary of two dielectrics, such as at a contact point of the linear boundary with an electrode, the field strength E may change as a function of K.ιm (ι is the distance from the contact point). The exponent m is negative or positive according to whether the ratio of the two dielectric constants, ε2/ε1, is greater or less than unity. A negative value of mresults in an infinitely high field strength at the point. In this paper, this field behavior is studied numerically by the charge simulation method and analytically by the variable separation method in both two-dimensional and axially symmetrical arrangements.

Keywords

This publication has 1 reference indexed in Scilit:

A Charge Simulation Method for the Calculation of High Voltage Fields
IEEE Transactions on Power Apparatus and Systems, 1974