Assessment of mismatched epitaxial layers by X-ray rocking curve measurements and simulations
- 1 June 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 50 (1-4) , 97-102
- https://doi.org/10.1016/0169-4332(91)90145-a
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Molecular beam epitaxy of Pb1-xSrxSe for the use in IR devicesJournal of Crystal Growth, 1991
- Composition and lattice-mismatch measurement of thin semiconductor layers by x-ray diffractionJournal of Applied Physics, 1987
- Characterization of thin layers on perfect crystals with a multipurpose high resolution x-ray diffractometerJournal of Vacuum Science & Technology B, 1983