The structure and electroluminescent characteristics of ZnS:Mn thin films

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Abstract
The dependence of structure and the electroluminescent properties of ZnS:Mn thin films on the substrate temperature has been investigated. The samples were electron-beam deposited on polycrystalline Y2O3 film and quartz glass substrates. Reflection high-energy electron diffraction experiments showed that the films had a zinc-blende structure and were composed of a double-fiber structure with the two [111] axes inclined at an angle to the substrate at substrate temperatures between 25 and 180 °C. At 200 °C substrate temperature the films consisted of a single-fiber structure with the [111] axis nearly perpendicular to the substrate surface. Electron-spin resonance measurements indicated that Mn2+ content in the films was nearly constant at substrate temperatures above 140 °C but steeply decreased below this temperature. Maximum electroluminescent intensity was obtained when the films were produced at 200 °C substrate temperature.

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