Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin films
- 1 January 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (4) , 345-355
- https://doi.org/10.1016/0304-3991(85)90201-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Computer simulation and interpretation of electron microscopic images of amorphous structuresThe Journal of Physical Chemistry, 1981
- Seeing order in ‘amorphous’ materialsNature, 1976
- Fourier Images IV: The Phase GratingProceedings of the Physical Society, 1960
- Electron diffraction study of evaporated carbon filmsActa Crystallographica, 1960