Prediction of secondary ion currents for trace elements in gallium arsenide in secondary ion mass spectrometry
- 31 December 1980
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 35 (5) , 281-285
- https://doi.org/10.1016/0584-8547(80)80091-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Carbon, oxygen and silicon impurities in gallium arsenideJournal of Physics D: Applied Physics, 1978
- Molecular versus atomic secondary ion emission from solidsThe Journal of Chemical Physics, 1978
- Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameterMicrochimica Acta, 1978
- Quantitative SIMS studies with a uranium matrixSurface Science, 1977
- Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standardsAnalytical Chemistry, 1977