Detailed characterization of TiC and TiN coatings prepared by the activated reactive evaporation process

Abstract
The objective is to investigate the relationship between the composition, microstructure, and microhardness of TiC and TiN coatings prepared over a range of process parameters using the activated reactive evaporation process. The composition was measured by Auger electron spectroscopy. The phase relationships and preferred orientation were obtained by x-ray diffraction analysis. Microhardness and adhesion of the coatings were measured. The results show that the microhardness depends on the composition/stoichiometry, phases present, the preferred orientation, and possibly the grain size in the case of single-phase coatings.