Measuring the outer shape of Pinus sylvestris saw logs with an X‐ray LogScanner
- 1 January 1998
- journal article
- Published by Taylor & Francis in Scandinavian Journal of Forest Research
- Vol. 13 (1-4) , 340-347
- https://doi.org/10.1080/02827589809382993
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Statistics for Engineering and the SciencesPublished by Taylor & Francis ,2016
- Automatic quality sorting of Picea abies logs with a gamma ray log scannerScandinavian Journal of Forest Research, 1993