An interferometric method to measure transient refractive index, birefringence and thickness variation of solids
- 1 July 1975
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 8 (7) , 611-614
- https://doi.org/10.1088/0022-3735/8/7/022
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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