Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains

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Abstract
Analyses of transmission electron microscopy observations of dislocations and faults oriented in mirror planes of as-grown single grains of icosahedral Al—Pd—Mn show that the Burgers vectors and associated fault vectors are perpendicular to the fault planes. These results suggest that climb processes have to be considered as realistic deformation modes at high temperatures in these materials.