Algorithms for Detection of Faults in Logic Circuits
- 1 November 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-20 (11) , 1258-1264
- https://doi.org/10.1109/t-c.1971.223125
Abstract
Programmed algorithms for test generation and test evaluation are described. The D-notation is introduced and a test generator (DALG) for combinational logic is presented. The sequential case is then examined. "Real life" constraints related to LSI testing are discussed. Two heuristic test generators satisfying these constraints are introduced. The iterative test generator (ITG) generates tests by transforming the given sequential circuit into an iterative combinational circuit. The macroblock test generator (MTG) uses the same approach but makes use of complex primitives (latches, triggers, etc.) to represent the circuit to be tested. Both the ITG and the MTG are not always guaranteed to generate good tests for each examined failure, and are used in connection with a test evaluator (simulator). Basic features of this evaluator are discussed.Keywords
This publication has 7 references indexed in Scilit:
- Minimizing the problem of logic testing by the interaction of a design group with user-oriented facilitiesPublished by Association for Computing Machinery (ACM) ,1970
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- On the Necessity to Examine D-Chains in Diagnostic Test Generation—An Example [Letter to the Editor]IBM Journal of Research and Development, 1967
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966
- Hazard Detection in Combinational and Sequential Switching CircuitsIBM Journal of Research and Development, 1965