Detection of Charged Particles in Thick Hydrogenated Amorphous Silicon Layers
- 1 January 1988
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Chapter 2 Density of States from Junction Measurements in Hydrogenated Amorphous SiliconPublished by Elsevier ,1984
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- Bandgap Dependence and Related Features of Radiation Ionization Energies in SemiconductorsJournal of Applied Physics, 1968