Measurement of Surface State Distributions in MOS Diodes with a Simple DLTS System

• 1 November 1980
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 19  (11) , 2307-2308
• https://doi.org/10.1143/jjap.19.2307

Abstract

Keywords

• MOS DIODES
• SURFACE STATE DISTRIBUTIONS
• SIMPLE DLTS SYSTEM