Reproducible sharp-pointed tip preparation for field ion microscopy by controlled ac polishing

1 October 1988

journal article
research article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 59 (10) , 2195-2197
https://doi.org/10.1063/1.1139985

Abstract

Sharp‐pointed tip preparation method by ac polishing has been improved by controlling the applying voltage, wave shape, phase angle, frequency, and number of waves. This was performed by designing a controller in cooperation with a function generator and an audio amplifier.

Keywords

ION MICROSCOPES
ION MICROSCOPY
OPTIMIZATION
SOLID−SOLID INTERFACES
ELECTRIC POTENTIAL
ELECTRONIC CIRCUITS
CONTROL EQUIPMENT

This publication has 1 reference indexed in Scilit:

AN IMPROVEMENT OF A TIP PREPARATION TECHNIQUE
Le Journal de Physique Colloques, 1987