Reflection Zernike phase contrast microscope
- 1 April 1990
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 29 (10) , 1408-1409
- https://doi.org/10.1364/ao.29.001408
Abstract
A novel configuration for a reflection Zernike phase contrast microscope is given that has a height sensitivity of 0.5 A.Keywords
This publication has 1 reference indexed in Scilit:
- Quantitative surface topography determination by Nomarski reflection microscopy I TheoryJournal of the Optical Society of America, 1979