XPS and Raman characterization of ion implanted polyparaphenylene thin films
- 30 April 1991
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 41 (1-2) , 291-294
- https://doi.org/10.1016/0379-6779(91)91065-i
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Chemical p doping of PPP thin films: Optical investigationsSynthetic Metals, 1989
- Low energy ion implantation studies of polyacetylene filmsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Influence of implantation parameters on the poly(paraphenylene) electrical conductivityNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Role of the modifications induced by ion beam irradiation in the optical and conducting properties of polyimideNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Optical properties of electropolymerized polyparaphenyleneSynthetic Metals, 1987
- The Evolution of Structure During The Alkali Metal Doping of Polyacetylene and Poly(p-Phenylene)Molecular Crystals and Liquid Crystals, 1985