Step-scan FT-IR photothermal spectral depth profiling of polymer films
- 1 January 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 223 (1) , 31-38
- https://doi.org/10.1016/0040-6090(93)90724-4
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
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