A 4096 x 1 static bipolar RAM

• 1 January 1977
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 68-69
• https://doi.org/10.1109/isscc.1977.1155629

Abstract

Keywords

• READ-WRITE MEMORY
• RANDOM ACCESS MEMORY
• PARASITIC CAPACITANCE
• DRIVER CIRCUITS
• DECODING
• CAMERAS
• INSTRUMENTS
• LOGIC
• PRODUCT DESIGN
• FAULT LOCATION