Long-time stability in TSAD semiconductor resistance thermometers at 0.4?4.2 K

• 1 February 1991
• journal article
• thermophysical measurements
• Published by Springer Nature in Measurement Techniques
• Vol. 34  (2) , 174-175
• https://doi.org/10.1007/bf00990826

Abstract

Keywords

• PHYSICAL CHEMISTRY
• ANALYTICAL CHEMISTRY
• SEMICONDUCTOR RESISTANCE