Density of silicon atoms in the Si(111)√3 × √3-Ag structure studied by in situ UHV reflection electron microscopy

This publication has 12 references indexed in Scilit:

• Structure analysis of the Si(111)√3 × √3R30°-Ag surface
  Physical Review Letters, 1991
• Structure analysis of Si(111)-(√3 × √3 )R30°/Ag using x-ray standing waves
  Physical Review B, 1991
• A study of the Si(111)3×3-Ag surface by transmission X-ray diffraction and X-ray diffraction topography
  Surface Science, 1991
• Gold adsorption processes on Si(111)7 × 7 studied by in-situ reflection electron microscopy
  Surface Science, 1990
• In-situ UHV electron microscope study of metal-silicon surfaces
  Applied Surface Science, 1990
• Rheed intensity analysis of Si(111)√3×√3-Ag structure
  Applied Surface Science, 1990
• Dynamic observation of gold adsorption on Si(111)7×7 surface by high-resolution reflection electron microscopy
  Ultramicroscopy, 1989
• The structure of Si(111)-()R30°-Ag determined by surface X-ray diffraction
  Surface Science, 1989
• Study on the Si(111) √3×√3-Ag Surface Structure by X-Ray Diffraction
  Japanese Journal of Applied Physics, 1988
• Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
  Surface Science, 1985