Hall effect measurements on Bridgman-grown CdxHg1-xTe and their analysis
- 1 March 1987
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 2 (3) , 136-144
- https://doi.org/10.1088/0268-1242/2/3/002
Abstract
No abstract availableKeywords
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