Measuring and minimizing diode detector nonlinearity
- 1 December 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-25 (4) , 324-329
- https://doi.org/10.1109/tim.1976.6312236
Abstract
This paper describes two techniques for measuring the linearity of amplitude detectors in general, and for measuring the deviation from square-law E of point-contact diode detectors in particular. A general mathematical model is given for determining the RF input power as a function of the detector output voltage. It is shown how to choose the value and the temperature coefficient of the video load resistance to minimize E and make E independent of temperature.Keywords
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