Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors
- 23 May 1996
- journal article
- Published by Trans Tech Publications, Ltd. in Solid State Phenomena
- Vol. 51-52, 585-596
- https://doi.org/10.4028/www.scientific.net/ssp.51-52.585
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