Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. II. Practice and experiments
- 1 November 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Electronics
- Vol. 13 (6) , 1220-1228
- https://doi.org/10.1109/63.728349
Abstract
No abstract availableKeywords
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