Defects in glasses examined by backscattered electron imaging and by x-ray wavelength and energy dispersive spectroscopy

This publication has 5 references indexed in Scilit:

• Atomic number and crystallographic contrast images with the SEM: a review of backscattered electron techniques
  Mineralogical Magazine, 1987
• Scanning Electron Microscopy
  Published by Springer Nature ,1985
• Quantitative microanalysis of individual particulates. I. Electron probe microanalysis of NBS-glass particulates
  Journal of Applied Physics, 1983
• Reference Samples for Electron Microprobe Analysis*
  Geostandards Newsletter, 1980
• FRAME C :
  Published by National Institute of Standards and Technology (NIST) ,1979