Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
- 7 May 2001
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 78 (19) , 2928-2930
- https://doi.org/10.1063/1.1371529
Abstract
We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: ∼10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of ∼1 nm. Using this system, we have measured the current–voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices.Keywords
This publication has 8 references indexed in Scilit:
- Ring Formation in Single-Wall Carbon NanotubesThe Journal of Physical Chemistry B, 1999
- Local densities, distribution functions, and wave-function correlations for spatially resolved shot noise at nanocontactsPhysical Review B, 1999
- Room-temperature transistor based on a single carbon nanotubeNature, 1998
- Electronic structure of atomically resolved carbon nanotubesNature, 1998
- Individual single-wall carbon nanotubes as quantum wiresNature, 1997
- Single-shell carbon nanotubes of 1-nm diameterNature, 1993
- Cobalt-catalysed growth of carbon nanotubes with single-atomic-layer wallsNature, 1993
- Helical microtubules of graphitic carbonNature, 1991