Specular and diffuse reflectivity from thin films containing misfit dislocations
- 1 April 1996
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 221 (1-4) , 230-234
- https://doi.org/10.1016/0921-4526(95)00930-2
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystalPhysical Review B, 1995
- High-resolution x-ray-scattering study of the structure of niobium thin films on sapphirePhysical Review B, 1993
- High resolution x-ray characterization of Co films on Al2O3Journal of Applied Physics, 1993
- Structural characterization of Nb on sapphire as a buffer layer for MBE growthJournal of Crystal Growth, 1993
- Growth morphology of epitaxial ErAs/GaAs by x-ray extended range specular reflectivityApplied Physics Letters, 1992
- Extraordinary alignment of Nb films with sapphire and the effects of added hydrogenPhysical Review B, 1992
- X-ray scattering study of lattice relaxation in ErAs epitaxial layers on GaAsApplied Physics Letters, 1991
- Epitaxial growth of ErAs on (100)GaAsApplied Physics Letters, 1988
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988