Stripline Measurements of Surface Resistance: Relation to HTSC Film Properties and Deposition Methods
- 19 March 1990
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 1187, 326-338
- https://doi.org/10.1117/12.965175
Abstract
We describe the measurement of microwave surface resistance, Rs, of thin films of high-transition-temperature superconductors by the stripline resonator method. This method allows measurement of Rs as a function of frequency from 0.5 GHz to 20 GHz and has a sensitivity of greater than 1 x10-7 Ω. Rs for films deposited by various methods has been measured, and a limited temperature dependence for one YBCO film is also reported. The results are related to the deposition methods and film properties.Keywords
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